Ensemble-designs 5400 Dual Sync Generator and Test Signal Generator Instrukcja Użytkownika Strona 1

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This data pack provides detailed installation, configuration and operation information for
the 5400 Dual Sync Generator and Test Signal Generator as part of the Avenue
Signal Integration System.
The module information in this data pack is organized into the following sections:
Module Overview
Applications
Installation
Cabling
Module Configuration and Control
°
Front Panel Controls and Indicators
°
Avenue PC Remote Control
°
Avenue Touch Screen Remote Control
Troubleshooting
Software Updating
Warranty and Factory Service
Specifications
5400-1
Model 5400
Dual Sync Generator
and Test Signal
Generator
Data Pack
Revision 5.1 SW v2.0
ENSEMBLE
DESIGNS
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Podsumowanie treści

Strona 1 - Data Pack

This data pack provides detailed installation, configuration and operation information forthe 5400 Dual Sync Generator and Test Signal Generator as pa

Strona 2 - MODULE OVERVIEW

Making Reference ChoicesEach generator can be independently set to operate either as a Master Sync Generator(using an internal precision frequency ref

Strona 3 - Secondary Out

Model 5400 Dual Sync Gen/Test Signal Generator5400-115400 Parameter TableCONTROL LOCAL REMOTE DEFAULTDEFAULTUSER LEVELPrimary SourceSwitch 1:InternalG

Strona 4 - Simultaneous References

5400 Parameter Table (Con’t)Model 5400 Dual Sync Gen/Test Signal Generator5400-12CONTROL LOCAL REMOTE DEFAULTDEFAULTUSER LEVELY/Cr/Cb ChannelEnableN/A

Strona 5 - Analog Composite References

5400 Parameter Table (Con’t)CONTROL LOCAL REMOTE DEFAULTDEFAULTUSER LEVELPulse SelectN/A AES Word Clock6 Hz 4:5 AlignAES Word Clock User 2Make EDH Err

Strona 6 - Local Setup

Front Panel Controls and IndicatorsEach front edge indicator and switch setting is shown in the diagram below:5400-14Remote/Local switch:Set to the

Strona 7 - 5400 Module

Avenue PC Remote ConfigurationThe Avenue PC remote control status menu for this module is illustrated and explainedbelow. Refer to the 5400 Parameter

Strona 8

The Secondary menu screen shown below allows you to set the following parameters forthe Secondary generator output:• Sec Source – select the Secondary

Strona 9

Model 5400 Dual Sync Gen/Test Signal GeneratorThe Test Pat menu allows you to set the type of test pattern desired for the Primaryoutput. Refer to App

Strona 10 - Making Reference Choices

Model 5400 Dual Sync Gen/Test Signal Generator5400-18The Slate menu screen shown below allows you to define four different text overlays Use the contr

Strona 11

Model 5400 Dual Sync Gen/Test Signal Generator5400-19The Pri Timing menu shown below allows you to set the timing of the Primary compositeoutput in re

Strona 12

MODULE OVERVIEWThe 5400 module is a stable timing source suitable for local reference generation for usein broadcast, remote trucks and post-productio

Strona 13

The Sec Timing menu shown below allows you to set the timing of the Secondarycomposite output in relation to the reference or the Primary Source with

Strona 14

The HD Sync menu allows you to set the HD standard and timing of the HD Sync outputin relation to the Primary serial output with the following control

Strona 15

The Config menu allows you to configure the reference from the external input (525, 625or 10 MHz sine wave) or the Master Frame Reference:• Config Ref

Strona 16

Model 5400 Dual Sync Gen/Test Signal GeneratorAvenue Touch Screen Remote ConfigurationThe Avenue Touch Screen remote control status menu for this modu

Strona 17

The Secondary menu screen shown below allows you to set the following parameters forthe Secondary generator output:• Sec Source – select the Secondary

Strona 18

5400-25The Test Pattern menu screen shown below allows you to set the type of test patterndesired for the Primary output. Refer to Appendix A for a co

Strona 19

The Slate menu screen shown below allows you to define four different text overlays Usethe controls to set the following:• Slate Select – select Off o

Strona 20

The Pri Timing menu screen allows you to set the timing of the Primary compositeoutput in relation to the reference with the following controls. For n

Strona 21

The HD Sync menu screen shown below allows you to set the HD standard and timing ofthe HD Sync output in relation to the Primary serial output with th

Strona 22

• FF CRC Error – same as AP CRC Error above except it is the Full Framewhich is transmitted incorrectly.• AP EDH Error – causes the AP EDH flag in the

Strona 23

Model 5400 Dual Sync Gen/Test Signal GeneratorThe Tri-Level Sync output is analog timing reference intended for use with high definitionequipment. It

Strona 24

TROUBLESHOOTINGAs a troubleshooting aid, the reference signal status and presence, power and CPU statuscan be easily monitored from the front panel of

Strona 25

Model 5400 Dual Sync Gen/Test Signal GeneratorWARRANTY AND FACTORY SERVICEWarrantyThis module is covered by a five year limited warranty, as stated in

Strona 26

SPECIFICATIONS5400 Dual Sync Generator/TSGReference Input Signal:Number: Two: External or Frame Master ReferenceSignal Type: 1 V p-p NTSC, PAL or 10 M

Strona 27

AES Audio Output (Optional with 5410)Number: TwoType: AES3id 1kHz tone or silentResolution: 24 bit Analog Audio Output (Optional with 5410)Number: One

Strona 28

Model 5400 Dual Sync Gen/Test Signal Generator5400-34

Strona 29

APPENDIX AThis appendix is provided to give details on each of the test patterns available on the5400 module. The primary generator provides test patt

Strona 30 - SOFTWARE UPDATING

MiscellaneousBlackCrossHatchSafeTitle (Rotary Switch Setting 8)Unit CircleMulti pattern (Rotary Switch Setting 9)Multi compositePathological (Rotary S

Strona 31 - WARRANTY AND FACTORY SERVICE

SMPTE Color BarsIn addition to pluge, SMPTE Color Bars includes a reverse sequence of bars. The reverse sequence helps adjust monitor levels on monito

Strona 32 - SPECIFICATIONS

Ramp Test PatternsRamp test patterns are very useful for evaluating linearity, missing bits, timing errors,and dynamic range.If there is a problem wit

Strona 33

Sweep Test PatternsSweep test patterns are used to evaluate frequency response by examining the envelope ofthe waveform on a waveform monitor.Full Fie

Strona 34

Model 5400 Dual Sync Gen/Test Signal Generator5400-4The on-board CPU can monitor and report module ID information (slot location, softwareversion and

Strona 35 - A.1 Test Patterns

Timing Test PatternsTiming test patterns are used to evaluate blanking area, field location, relative luma andchroma timing, and cositing.Analog Blank

Strona 36 - A.2 TEST PATTERN DESCRIPTIONS

Miscellaneous Test PatternsThe following test patterns have special purposes.CrosshatchThe crosshatch test pattern consists of horizontal and vertical

Strona 37

Model 5400 Dual Sync Gen/Test Signal Generator5400-A6

Strona 38

Analog Composite ReferencesAnother application for the 5400 is to combine it with the 5405, a Dual Analog SyncGenerator, to output a set of independen

Strona 39

INSTALLATIONLocal SetupIf you will be using the module in Local mode, you will need to use the rotary switchshown in the figure below to select the te

Strona 40

5410 SubmoduleInstall the 5410 submodule by lining up the connectors on the submodule with the connec-tors on the 5400 module. The connector is keyed

Strona 41

Model 5400 Dual Sync Gen/Test Signal Generator3 RU BackplaneConnect the Pri Cpst 1and Pri Cpst 2 outputBNCs to compositeanalog destinations.Connect th

Strona 42

MODULE CONFIGURATION AND CONTROLThe configuration parameters for each Avenue module must be selected after installation.This can be done remotely usin

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